- Ph.D., Computer Science, Illinois Institute of Technology Chicago, Illinois. December 2001.
- M.S., Computer Science, Illinois Institute of Technology Chicago, Illinois. December 1988.
- B.A., Liberal Arts, University of Notre Dame Notre Dame, Indiana. May 1981.
- Association for Software Testing (AST), President 2005-06, 2004-05
- Milwaukee Software Process Improvement Network (SPIN), Vice President 2006-07, 2005-06
- Second International Workshop on Software Quality (SOQUA), Co-Program Chair (2005)
- Assistant Professor, University of Wisconsin - Milwaukee, Department of Electrical Engineering and Computer Science, 2001 - 2004
- Ph.D. Candidate, Instructor, Illinois Institute of Technology, Chicago, IL. 1996 - 2001.
- Member of Technical Staff, AT&T Bell Laboratories,1989 – 1996. Involved in all aspects of software quality assurance and testing for the international version of AT&T's telephone switch (5ESS). Chairman, AT&T Software Reliability Engineering Users' Group (1993-96).
- Systems Analyst, Baxter Healthcare Corporation, 1981 – 1989. Designed, developed and installed a wide variety of software applications, including: IT applications to support corporate payroll and personnel departments; commercial applications as part of Baxter's entrepreneurial entry into Pharmacy Management Systems; and real-time and data analysis applications to support corporate R&D.
- P.J. Schroeder, D. Rothe, "Teaching Unit Testing using Test-Driven Development," 4th Annual Workshop on Teaching Software Testing (WTST 4), February 2005, Melbourne, FL, http://www.testingeducation.org/conference/wtst4/pjs_wtst4.pdf.
- James Bach, P.J. Schroeder, "Pairwise Testing: A Best Practice that Isn't," Proceeding of the Pacific Northwest Quality Conference 2004 (PNSQC 2004). October 12-13, 2004. Portland, OR (USA), pp. 175-191.
- S. Bedi, P.J. Schroeder, "Observations on the Implementation and Testing of Scripted Web Applications," Proceedings of the Sixth IEEE International Workshop on Web Site Evolution (WSE 2004). September 11, 2004. Chicago, IL (USA), pp. 20-27.
- P.J. Schroeder, P. Bolaki, Vijayram Gopu, "Comparing the Fault Detection Effectiveness of N-way and Random Test Suites," In Proceedings of the International Symposium on Empirical Software Engineering (ISESE 2004). August 19-20, 2004. Redondo Beach California (USA), pp. 49-59.
P.J. Schroeder, Eok Kim, Vijayram Gopu, "Model-based Test Case Design and Generation for Automated Testing," In Proceedings of the 8th World Multi-Conference on Systemics, Cybernetics, and Informatics (SCI 2004). July 18-21, 2004. Orlando, FL (USA).
- P.J. Schroeder, S.A. Kearns, "Involving Testing Students in Software Projects II," Third Annual Workshop on Teaching Software Testing (WTST 3), February 2004, Melbourne, FL, http://www.testingeducation.org/conference/wtst_pjs.htm.
- P.J. Schroeder, E. Kim, J. Arshem, P. Bolaki, "Combining Behavior and Data Modeling in Automated Test Case Generation,” In Proceedings of the Third International Conference on Quality Software (QSIC), November 2003, Dallas Texas, pp. 247-254.
- C. Cheng, A. Dumitrescu, P.J. Schroeder, "Generating Small Test Suites for Non-uniform Instances,” In Proceedings of the Third International Conference on Quality Software (QSIC), November 2003, Dallas Texas, pp. 76-82.
- P.J. Schroeder, “Involving Testing Students in Software Projects,” Second Annual Workshop on Teaching Software Testing (WTST 2), February 2003, Melbourne, FL.
- P.J. Schroeder, B. Korel, P. Faherty, "Generating Expected Results for Automated Black-Box Testing," In Proceedings of the Automated Software Engineering Conference, September 2002, Edinburgh, UK, pp. 139-48.
- P.J. Schroeder and B. Korel, "Maintaining the Quality of Black-Box Testing," CrossTalk: The Journal of Defense Software Engineering, Vol. 14, No. 5, pp. 24-28, May 2001.
- P.J. Schroeder and B. Korel, "Constraint of Model-Based Test Generation Using Input-Output Analysis," In Proceedings of the Automated Software Engineering 2000 Doctoral Symposium, September 2000, Grenoble, France, pp. 35-43.
- P.J. Schroeder and B. Korel, "Black-Box Test Reduction Using Input-Output Analysis," In Proceedings of the International Symposium on Software Testing and Analysis(ISSTA), August 2000, Portland, Oregon, pp. 21-24.
- J.R. Nickles, H.L. Raether, P.J. Schroeder, "Evolving Strategies for Intelligent Network Testing," In Proceedings of the XIV International Switching Symposium (ISS '92), October, 1992, Yokohama, Japan, pp. 21-26.